We help scientists to compare scientific instruments
Compare Products
[-]OFFBEAT
Instrument Type

Atomic Force Microscope

Technology

Atomic Force Microscopy

Awards

R&D Award (2009)

No of Modes

60+ SPM modes in basic configuration

Modes
Contact
Amplitude Modulation
Spectroscopy
Lithography
HybriD Mode™
Spreading-Resistance
Dark mode SRI
LFM
PFM
MFM
Electrostatic Force Microscopy
Scanning Capacitance
Permittivity mapping
Kelvin Probe
STM
Nanosclerometry
Nanoindentation
+
Active bean monitoring

No

Active beam monitoring

Yes

Power hot liquid system

Yes

Hot Liquid temperature programmes

RT - 150 °C

Intelligent preheating

Yes

Pressure

.1 MPa...1000 GPa

Settings and programming options

.

Technologies

HybriD Mode™ (HD-AFM™ Mode)

A la carte bean selection

No

A la carte beam selection

Yes

Programmable levels of strength

continiously

Strength can be adjusted for each preparation

Yes

Automatic Function

Automatic completition of the alignment in 10 seconds

Sample Dimension

up to 40 g

up to 20 mm in diameter, up to 10 mm in height

System of sample positioning

Automated, video monitored

Wireless ready

No

Display

TFT color screen

In figures

- Water tank capacity
Voltage: 115 - 240 alternating current
Ampacity:
Frequency: 50 / 60 Hz
Weight: 25 kg
Width: 47 cm
Height: 21 cm
Depth: 26 cm

Price

~ EUR 80.000+

[-]Atomic Force Microscope
AFM TypeStand-alone
AFM Scan Size X/Y/Z µm3 x 3 x 2 or 100 x 100 x 10
AFM Electrical Sample CharaterizationYes
AFM Force SpectroscopyYes

ABOUT Science Duel Life

science.duel.life & mynexttool Is a Free-Access Scientific Instrument Database.

Accurate and truthful parameter filters for all instruments and manufacturers provide a positive experience to our users.

CONTACT

New York, NY

Berlin, Germany

CUSTOMER SUPPORT

Come back tomorrow for more.